Panoptes Root Cause Analysis (RCA)

Revolutionizes the workflow of process engineers

Panoptes RCA is an AI-powered assistant that provides process engineers with real-time analysis of anomalies and alarm events in statistical process control.
AI technology image with finger pointing to data tables
VM
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RCA
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IM
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Panoptes Virtual Metrology

Reinvents process monitoring and control

Panoptes VM predicts key features of a process outcome based on equipment sensor data for real-time process monitoring and control.

Features

To overcome the limit on metrology resources, Panoptes IM enhances higher-throughput, lower-quality images by advanced denoising techniques. This enables faster acquisition without any loss in the image quality. In addition to automatically measuring all conventional measurands in a given image, Panoptes IM also detects anomalies within the image and identifies their causes, which serves as another indicator for yield changes. In order to handle diverse metrology recipes, Panoptes IM provides a unified set of recipes, or methods and procedures for measuring features in images. These recipes are created, tested, deployed, and managed in an engineering platform, which is integrated seamlessly with existing manufacturing systems.
Image Enhancement
‍ reduces the image acquisition time without accuracy loss
Anomaly Detection
alerts for outliers and
identifies possible causes
Automatic Metrology
adapts common recipes quickly to new products, processes, and measurands
Integrated Engineering Platform
‍ creates, tests, deploys, and
manages diverse recipes

SK hynix Deploys Gauss Labs’s AI-Based Virtual Metrology Solution to Predict Wafer Manufacturing Process Outcomes

By predicting wafer process outcomes based on sensor data, Panoptes VM reduces process variability by 21.5% on average and ultimately improves the yield as well.
Learn More

Download the product brochure

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DOWNLOAD
Panoptes Root Cause Analysis (RCA)

Revolutionizes the workflow of process engineers

Panoptes RCA is an AI-powered assistant that provides process engineers with real-time analysis of anomalies and alarm events in statistical process control.
AI technology image with finger pointing to data tables

Features

To overcome the limit on metrology resources, Panoptes IM enhances higher-throughput, lower-quality images by advanced denoising techniques. This enables faster acquisition without any loss in the image quality. In addition to automatically measuring all conventional measurands in a given image, Panoptes IM also detects anomalies within the image and identifies their causes, which serves as another indicator for yield changes. In order to handle diverse metrology recipes, Panoptes IM provides a unified set of recipes, or methods and procedures for measuring features in images. These recipes are created, tested, deployed, and managed in an engineering platform, which is integrated seamlessly with existing manufacturing systems.
Image Enhancement
‍ reduces the image acquisition time without accuracy loss
Anomaly Detection
alerts for outliers and
identifies possible causes
Automatic Metrology
adapts common recipes quickly to new products, processes, and measurands
Integrated Engineering Platform
‍ creates, tests, deploys, and
manages diverse recipes

Download the Product Brochure

DOWNLOAD
DOWNLOAD

Shatters the limit of conventional image metrology solutions

Panoptes IM is an integrated image metrology solution that overcomes the physical and software limits of conventional measurement tools through state-of-the-art computer vision technology.
Data technology board

Features

To overcome the limit on metrology resources, Panoptes IM enhances higher-throughput, lower-quality images by advanced denoising techniques. This enables faster acquisition without any loss in the image quality. In addition to automatically measuring all conventional measurands in a given image, Panoptes IM also detects anomalies within the image and identifies their causes, which serves as another indicator for yield changes. In order to handle diverse metrology recipes, Panoptes IM provides a unified set of recipes, or methods and procedures for measuring features in images. These recipes are created, tested, deployed, and managed in an engineering platform, which is integrated seamlessly with existing manufacturing systems.
Image Enhancement
‍ reduces the image acquisition time without accuracy loss
Anomaly Detection
alerts for outliers and
identifies possible causes
Automatic Metrology
adapts common recipes quickly to new products, processes, and measurands
Integrated Engineering Platform
‍ creates, tests, deploys, and
manages diverse recipes

Download the Product Brochure

DOWNLOAD
DOWNLOAD
VM
RCA
IM
Panoptes Root Cause Analysis (RCA)

Revolutionizes the workflow of process engineers

Panoptes RCA is an AI-powered assistant that provides process engineers with real-time analysis of anomalies and alarm events in statistical process control.
AI technology image with finger pointing to data tables

Features

Panoptes RCA collects all relevant manufacturing information from scattered databases and uses state-of-the-art time series machine learning techniques to analyze them in an integrated manner. It quickly and accurately identifies the root cause of the alarm based on anomaly analysis with different data types such as machine sensor data and sampled metrology data. It displays analysis results on a comprehensive and easy-to-understand dashboard. Panoptes RCA also provides actionable guidelines learned from historical corrective actions that process engineers have taken under similar circumstances.
Anomaly Analysis
generates anomaly scores of probable root causes via time series machine learning
Dashboard
displays comprehensive and user-friendly information related to alarms
Action Recommendation
provides data-driven guidelines for engineers on how to resolve alarms

Download the Product Brochure

DOWNLOAD
DOWNLOAD
Panoptes Root Cause Analysis (RCA)

Revolutionizes the workflow of process engineers

Panoptes RCA is an AI-powered assistant that provides process engineers with real-time analysis of anomalies and alarm events in statistical process control.

Features

Panoptes RCA collects all relevant manufacturing information from scattered databases and uses state-of-the-art time series machine learning techniques to analyze them in an integrated manner. It quickly and accurately identifies the root cause of the alarm based on anomaly analysis with different data types such as machine sensor data and sampled metrology data. It displays analysis results on a comprehensive and easy-to-understand dashboard. Panoptes RCA also provides actionable guidelines learned from historical corrective actions that process engineers have taken under similar circumstances.
Anomaly Analysis
generates anomaly scores of probable root causes via time series machine learning
Dashboard
displays comprehensive and user-friendly information related to alarms
Action Recommendation
provides data-driven guidelines for engineers on how to resolve alarms

Download the Product Brochure

DOWNLOAD
DOWNLOAD